Desktop Scanning Electron Microscope | ZEM18
A desktop SEM is a compact and user-friendly scanning electron microscope designed for high-resolution imaging and analysis of samples at the nanoscale. It offers the powerful capabilities of traditional SEMs in a smaller, more accessible format suitable for laboratories, educational institutions, and industrial settings.
The ZEM18 desktop SEM offers high-performance signal acquisition with a bandwidth of up to 10 MHz, enabling fast scanning speeds and real-time observation in video mode. It eliminates ghosting and shadowing effects, ensuring that every detail is captured clearly. The system supports integration with SE (Secondary Electron), BSE (Backscattered Electron), and EDS (Energy Dispersive Spectroscopy) detectors, allowing for comprehensive analysis of sample element composition and topographic contrast. This versatility makes it an ideal tool for detailed material characterization in a compact, user-friendly design.
Environmental requirements | AC 220V, 50Hz, 1kW, no shock absorbing stage required |
Accelerating voltage | 3kV~18kV continuously adjustable, 1kV stepping |
Electron gun | Pre-centered tungsten filament, one-piece condenser mirror, no need to manually adjust the objective diaphragm, optional LaB6 filament |
Magnification | 200000x |
Detector | Four-division backscattered electron detector, secondary electron detector (optional), integrated spectrometer (optional) |
Sample stage travel | XY electric sample table, moving stroke: 30mm x 30mm |
Sample size | Φ50 x 35 (H)mm |
Working distance | 5 - 30mm |
Vacuum mode | High vacuum mode: vacuum time less than 90s; Low vacuum mode (optional): 1-60Pa automatic control |
Imaging mode | Video mode: 512x512 pixels, no need for small window scanning; Fast mode: scanning time less than 3s, 512x512 pixels; W scan mode: 2048x2048 pixels; image format: BMP, TIFF, JPEG, PNG |
Navigation function | Optical CCD navigation |
Automatic function | Automatic brightness contrast, automatic focusing, automatic dispersion, large picture splicing |
Dimensions | 320 x 610 x 540 (mm) |
Extension function | Compatible with ZEPTOOLS, a variety of in-situ function sample stages (stretching stage, heating stage, TEC cold stage, and other in-situ test systems) |
Desktop Scanning Electron Microscope | ZEM18
| Prod# | Description | Unit | Price |
|---|---|---|---|
| ZEM18 | Desktop Scanning Electron Microscope | each | P.O.R |
Q:How can I place an order?
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